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Journal: Materials, 2020
Volume: 13
Number: 4517
Article:
Microcomputed X-Ray Tomographic Imaging and Image Processing for Microstructural Characterization of Explosives
Authors:
by
John D. Yeager, Lindsey A. Kuettner, Amanda L. Duque, Larry G. Hill and Brian M. Patterson
Link:
https://www.mdpi.com/1996-1944/13/20/4517
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