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Open AccessArticle

Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate

1
Department of Physics, Faculty of Electrical Engineering and Communication, Brno University of Technology, Technická 2848/8, 616 00 Brno, Czech Republic
2
Central European Institute of Technology BUT, Purkyňova 123, 612 00 Brno, Czech Republic
3
Faculty of Physics, Dagestan State University, 367015 Makhachkala, st. M. Gadjieva 43-a, Dagestan Republic, Russia
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Faculty of Mechanical Engineering, Institute of Physical Engineering, Brno University of Technology, Technická 2896/2, 616 69 Brno, Czech Republic
5
Institute of Scientific Instruments of the Czech Academy of Sciences, Královopolská 147, 612 64 Brno, Czech Republic
*
Author to whom correspondence should be addressed.
Materials 2020, 13(10), 2402; https://doi.org/10.3390/ma13102402
Received: 22 April 2020 / Revised: 18 May 2020 / Accepted: 20 May 2020 / Published: 23 May 2020
(This article belongs to the Section Structure Analysis and Characterization)
The objective of this work is to study the delamination of bismuth ferrite prepared by atomic layer deposition on highly oriented pyrolytic graphite (HOPG) substrate. The samples’ structures and compositions are provided by XPS, secondary ion mass spectrometry (SIMS) and Raman spectroscopy. The resulting films demonstrate buckling and delamination from the substrates. The composition inside the resulting bubbles is in a gaseous state. It contains the reaction products captured on the surface during the deposition of the film. The topography of Bi-Fe-O thin films was studied in vacuum and under atmospheric conditions using simultaneous SEM and atomic force microscopy (AFM). Besides complementary advanced imaging, a correlative SEM-AFM analysis provides the possibility of testing the mechanical properties by using a variation of pressure. In this work, the possibility of studying the surface tension of the thin films using a joint SEM-AFM analysis is shown. View Full-Text
Keywords: surface delamination; graphite substrate; atomic layer deposition; combined imaging; surface tension surface delamination; graphite substrate; atomic layer deposition; combined imaging; surface tension
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MDPI and ACS Style

Sobola, D.; Ramazanov, S.; Konečný, M.; Orudzhev, F.; Kaspar, P.; Papež, N.; Knápek, A.; Potoček, M. Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. Materials 2020, 13, 2402.

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