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Journal: Materials, 2020
Volume: 13
Number: 113
Article:
Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films
Authors:
by
Fengbo Han, Wenyuan Zhao, Ran Bi, Feng Tian, Yadan Li, Chuantao Zheng and Yiding Wang
Link:
https://www.mdpi.com/1996-1944/13/1/113
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