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Journal: Materials, 2019
Volume: 12
Number: 3119
3119
Article: Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes
Authors: by Banglong Liang, Zili Wang, Cheng Qian, Yi Ren, Bo Sun, Dezhen Yang, Zhou Jing and Jiajie Fan
Link: https://www.mdpi.com/1996-1944/12/19/3119

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