Liang, B.; Wang, Z.; Qian, C.; Ren, Y.; Sun, B.; Yang, D.; Jing, Z.; Fan, J.
Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes. Materials 2019, 12, 3119.
https://doi.org/10.3390/ma12193119
AMA Style
Liang B, Wang Z, Qian C, Ren Y, Sun B, Yang D, Jing Z, Fan J.
Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes. Materials. 2019; 12(19):3119.
https://doi.org/10.3390/ma12193119
Chicago/Turabian Style
Liang, Banglong, Zili Wang, Cheng Qian, Yi Ren, Bo Sun, Dezhen Yang, Zhou Jing, and Jiajie Fan.
2019. "Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes" Materials 12, no. 19: 3119.
https://doi.org/10.3390/ma12193119
APA Style
Liang, B., Wang, Z., Qian, C., Ren, Y., Sun, B., Yang, D., Jing, Z., & Fan, J.
(2019). Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes. Materials, 12(19), 3119.
https://doi.org/10.3390/ma12193119