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Journal: Materials, 2019
Volume: 12
Number: 2462
2462
Article: Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe₃ Crystal
Authors: by Bum Jun Kim, Byung Joo Jeong, Seungbae Oh, Sudong Chae, Kyung Hwan Choi, Tuqeer Nasir, Sang Hoon Lee, Hyung Kyu Lim, Ik Jun Choi, Min-Ki Hong, Hak Ki Yu, Jae-Hyun Lee and Jae-Young Choi
Link: https://www.mdpi.com/1996-1944/12/15/2462

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