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Journal: Materials, 2019
Volume: 12
Number: 1739
Article:
Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si1−xGex Thin-Film Transistors
Authors:
by
Kyungsoo Jang, Youngkuk Kim, Joonghyun Park and Junsin Yi
Link:
https://www.mdpi.com/1996-1944/12/11/1739
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