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Materials 2018, 11(8), 1331;

Determining the Nitrogen Content in (Oxy)Nitride Materials

Univ. Rennes, CNRS, ISCR (Institut des Sciences Chimiques de Rennes)—UMR 6226, F-35000 Rennes, France
Received: 19 June 2018 / Revised: 28 July 2018 / Accepted: 30 July 2018 / Published: 1 August 2018
(This article belongs to the Special Issue Nitride Ceramics: Synthesis, Properties and Applications)
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Nitrogen (and also oxygen) determination has become an important parameter to characterize (oxy)nitride materials for many properties and applications. Analyzing such anions with accuracy is still a challenge for some materials. However, to date, a large panel of methodologies is available to answer this issue with relevant results, even for thin films. Carrier gas hot extraction techniques and electron probe microanalysis with wavelength dispersive spectroscopy (EPMA-WDS) look attractive to analyze bulk materials and thin films, respectively. This paper gathers several techniques using chemical and physical routes to access such anionic contents. Limitations and problems are pointed out for both powders and films. View Full-Text
Keywords: nitrogen analysis; (oxy)nitride; powder; thin films nitrogen analysis; (oxy)nitride; powder; thin films

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Tessier, F. Determining the Nitrogen Content in (Oxy)Nitride Materials. Materials 2018, 11, 1331.

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