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Ultra Uniform Pb0.865La0.09(Zr0.65Ti0.35)O3 Thin Films with Tunable Optical Properties Fabricated via Pulsed Laser Deposition

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School of Optical and Electronic Information, Engineering Research Center for Functional Ceramics, Ministry of Education, Huazhong University of Science and Technology, Wuhan 430074, China
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State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China
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School of Physics and Electronic Engineering, Guangzhou University, Guangzhou 510006, China
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Department of Energy Materials and Technology, General Research Institute for Nonferrous Metals, Beijing 100088, China
*
Author to whom correspondence should be addressed.
Materials 2018, 11(4), 525; https://doi.org/10.3390/ma11040525
Received: 12 February 2018 / Revised: 27 March 2018 / Accepted: 28 March 2018 / Published: 29 March 2018
(This article belongs to the Section Thin Films)
Ferroelectric thin films have been utilized in a wide range of electronic and optical applications, in which their morphologies and properties can be inherently tuned by a qualitative control during growth. In this work, we demonstrate the evolution of the Pb0.865La0.09(Zr0.65Ti0.35)O3 (PLZT) thin films on MgO (200) with high uniformity and optimized optical property via the controls of the deposition temperatures and oxygen pressures. The perovskite phase can only be obtained at the deposition temperature above 700 °C and oxygen pressure over 50 Pa due to the improved crystallinity. Meanwhile, the surface morphologies gradually become smooth and compact owing to spontaneously increased nucleation sites with the elevated temperatures, and the crystallization of PLZT thin films also sensitively respond to the oxygen vacancies with the variation of oxygen pressures. Correspondingly, the refractive indices gradually develop with variations of the deposition temperatures and oxygen pressures resulted from the various slight loss, and the extinction coefficient for each sample is similarly near to zero due to the relatively smooth morphology. The resulting PLZT thin films exhibit the ferroelectricity, and the dielectric constant sensitively varies as a function of electric filed, which can be potentially applied in the electronic and optical applications. View Full-Text
Keywords: thin films; pulsed laser deposition; deposition temperatures; annealing oxygen pressures; reflectance thin films; pulsed laser deposition; deposition temperatures; annealing oxygen pressures; reflectance
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MDPI and ACS Style

Jiang, S.; Huang, C.; Gu, H.; Liu, S.; Zhu, S.; Li, M.-Y.; Yao, L.; Wu, Y.; Zhang, G. Ultra Uniform Pb0.865La0.09(Zr0.65Ti0.35)O3 Thin Films with Tunable Optical Properties Fabricated via Pulsed Laser Deposition. Materials 2018, 11, 525.

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