Chen, W.; Wu, W.; Zhou, L.; Xu, M.; Wang, L.; Ning, H.; Peng, J.
A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors. Materials 2018, 11, 416.
https://doi.org/10.3390/ma11030416
AMA Style
Chen W, Wu W, Zhou L, Xu M, Wang L, Ning H, Peng J.
A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors. Materials. 2018; 11(3):416.
https://doi.org/10.3390/ma11030416
Chicago/Turabian Style
Chen, Weifeng, Weijing Wu, Lei Zhou, Miao Xu, Lei Wang, Honglong Ning, and Junbiao Peng.
2018. "A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors" Materials 11, no. 3: 416.
https://doi.org/10.3390/ma11030416
APA Style
Chen, W., Wu, W., Zhou, L., Xu, M., Wang, L., Ning, H., & Peng, J.
(2018). A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors. Materials, 11(3), 416.
https://doi.org/10.3390/ma11030416