Order Article Reprints
Journal: EnergiesVolume: 17Number: 5476
Article: Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs
- Authors:
- Joao Oliveira1,*,
- Jean-Michel Reynes1 and
- Hervé Morel2
- et al.
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.