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Journal: Energies, 2024
Volume: 17
Number: 5476
5476
Article: Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs
Authors: by Joao Oliveira, Jean-Michel Reynes, Hervé Morel, Pascal Frey, Olivier Perrotin, Laurence Allirand, Stéphane Azzopardi, Michel Piton and Fabio Coccetti
Link: https://www.mdpi.com/1996-1073/17/21/5476

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