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Journal: Energies, 2023
Volume: 16
Number: 870
Article:
The Experimentally Measured Influence of the Si-MOSFET Replacement Switches to WBG Transistors in the Voltage Source Inverters as the Source of Radiation Noise
Authors:
by
Krzysztof Bernacki and Zbigniew Rymarski
Link:
https://www.mdpi.com/1996-1073/16/2/870
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