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IJERPH
Volume 15
Issue 4
10.3390/ijerph15040642
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Journal: Int. J. Environ. Res. Public Health, 2018
Volume: 15
Number: 642

Article: Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics among Semiconductor Workers
Authors: by Sangjun Choi, Wonseok Cha, Jihoon Park, Seungwon Kim, Won Kim, Chungsik Yoon, Ju-Hyun Park, Kwonchul Ha and Donguk Park
Link: https://www.mdpi.com/1660-4601/15/4/642

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