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Open AccessArticle
Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features
by
Kody A. Wilson
Kody A. Wilson *,
Michael L. Dexter
Michael L. Dexter
,
Benjamin F. Akers
Benjamin F. Akers and
Anthony L. Franz
Anthony L. Franz
Center for Technical Intelligence Studies and Research, Air Force Institute of Technology, 2950 Hobson Way, Fairborn, OH 45433, USA
*
Author to whom correspondence should be addressed.
Sensors 2026, 26(17), 5326; https://doi.org/10.3390/s26175326 (registering DOI)
Submission received: 29 July 2026
/
Revised: 18 August 2026
/
Accepted: 20 August 2026
/
Published: 22 August 2026
Abstract
Observations of time-varying scenes using a Fourier-transform spectrometer can produce scene-change artifacts in the measured spectra. These artifacts typically appear as oscillations in the spectra and are often mistaken for noise. Interferogram-offset scene-change artifacts arise from an incorrect interferogram offset estimate. The error is Fourier-transformed and superimposed onto the measured spectrum. The recently developed smooth offset correction method removes these artifacts. Prior to this work, this correction method had only been applied to spectrally smooth targets. Concerns have been raised regarding its application to targets with structured spectra. In addition to the interferogram-offset scene-change artifacts, higher-order artifacts are predicted to be significant for structured spectra. Linear scene-change artifacts occur when a target moves with constant velocity through the field of view, and quadratic scene-change artifacts occur when a target moves with constant acceleration. These artifacts are largest near abrupt spectral transitions. Despite this, the higher-order artifacts remain relatively small and have minimal impact on spectral accuracy. We conclude that, after smooth offset correction, the remaining scene-change artifacts can be ignored when examining spectrally smooth targets such as notch filters.
Share and Cite
MDPI and ACS Style
Wilson, K.A.; Dexter, M.L.; Akers, B.F.; Franz, A.L.
Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors 2026, 26, 5326.
https://doi.org/10.3390/s26175326
AMA Style
Wilson KA, Dexter ML, Akers BF, Franz AL.
Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors. 2026; 26(17):5326.
https://doi.org/10.3390/s26175326
Chicago/Turabian Style
Wilson, Kody A., Michael L. Dexter, Benjamin F. Akers, and Anthony L. Franz.
2026. "Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features" Sensors 26, no. 17: 5326.
https://doi.org/10.3390/s26175326
APA Style
Wilson, K. A., Dexter, M. L., Akers, B. F., & Franz, A. L.
(2026). Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors, 26(17), 5326.
https://doi.org/10.3390/s26175326
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