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Article

Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features

Center for Technical Intelligence Studies and Research, Air Force Institute of Technology, 2950 Hobson Way, Fairborn, OH 45433, USA
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Author to whom correspondence should be addressed.
Sensors 2026, 26(17), 5326; https://doi.org/10.3390/s26175326 (registering DOI)
Submission received: 29 July 2026 / Revised: 18 August 2026 / Accepted: 20 August 2026 / Published: 22 August 2026
(This article belongs to the Section Sensing and Imaging)

Abstract

Observations of time-varying scenes using a Fourier-transform spectrometer can produce scene-change artifacts in the measured spectra. These artifacts typically appear as oscillations in the spectra and are often mistaken for noise. Interferogram-offset scene-change artifacts arise from an incorrect interferogram offset estimate. The error is Fourier-transformed and superimposed onto the measured spectrum. The recently developed smooth offset correction method removes these artifacts. Prior to this work, this correction method had only been applied to spectrally smooth targets. Concerns have been raised regarding its application to targets with structured spectra. In addition to the interferogram-offset scene-change artifacts, higher-order artifacts are predicted to be significant for structured spectra. Linear scene-change artifacts occur when a target moves with constant velocity through the field of view, and quadratic scene-change artifacts occur when a target moves with constant acceleration. These artifacts are largest near abrupt spectral transitions. Despite this, the higher-order artifacts remain relatively small and have minimal impact on spectral accuracy. We conclude that, after smooth offset correction, the remaining scene-change artifacts can be ignored when examining spectrally smooth targets such as notch filters.
Keywords: scene change artifact (SCA); smooth offset correction (SOC); Fourier-transform spectroscopy (FTS); hyperspectral imaging (HSI) scene change artifact (SCA); smooth offset correction (SOC); Fourier-transform spectroscopy (FTS); hyperspectral imaging (HSI)

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MDPI and ACS Style

Wilson, K.A.; Dexter, M.L.; Akers, B.F.; Franz, A.L. Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors 2026, 26, 5326. https://doi.org/10.3390/s26175326

AMA Style

Wilson KA, Dexter ML, Akers BF, Franz AL. Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors. 2026; 26(17):5326. https://doi.org/10.3390/s26175326

Chicago/Turabian Style

Wilson, Kody A., Michael L. Dexter, Benjamin F. Akers, and Anthony L. Franz. 2026. "Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features" Sensors 26, no. 17: 5326. https://doi.org/10.3390/s26175326

APA Style

Wilson, K. A., Dexter, M. L., Akers, B. F., & Franz, A. L. (2026). Offset, Linear and Quadratic Scene-Change Artifact Comparison in Fourier-Transform Spectroscopy of a Target with Sharp Spectral Features. Sensors, 26(17), 5326. https://doi.org/10.3390/s26175326

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