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Article

Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection

by
Gökhan Şahin
1,2,*,
Ali Cengiz Rüstemli
3,
Ahmed Yaseen Bishree Al-Ani
4,
Sabir Rüstemli
4 and
Erdal Akin
5,6,*
1
Copernicus Institute of Sustainable Development, Utrecht University, Princetonlaan 8A, 3584 CB Utrecht, The Netherlands
2
Energy Advisor in the Municipality of Dronten, De Rede, 1, 8251 ER Dronten, The Netherlands
3
Software Engineering Department, Engineering Faculty, Ostim Teknik University, 06000 Ankara, Türkiye
4
Electrical-Electronics Engineering Department, Engineering and Architecture Faculty, Bitlis Eren University, 13000 Bitlis, Turkey
5
Department of Computer Science and Media Technology, Malmö University, 205 06 Malmö, Sweden
6
Department of Computer Engineering, Bitlis Eren University, 13100 Bitlis, Türkiye
*
Authors to whom correspondence should be addressed.
Sensors 2026, 26(13), 4256; https://doi.org/10.3390/s26134256 (registering DOI)
Submission received: 27 May 2026 / Revised: 2 July 2026 / Accepted: 2 July 2026 / Published: 4 July 2026
(This article belongs to the Special Issue Fault Diagnosis Based on Sensing and Control Systems)

Abstract

This study proposes a deep learning-based framework for the automated classification of photovoltaic solar cells as defective or normal using electroluminescence (EL) imaging. A balanced dataset containing 20,400 EL images, comprising 10,200 defective and 10,200 normal solar cells, was used for model development and evaluation. To reflect practical inspection requirements, cracked and broken cells were combined into a single defective category, resulting in a binary classification task. The dataset includes both monocrystalline and polycrystalline solar cells, which were analyzed together within a unified classification framework to improve applicability to real-world photovoltaic systems. To ensure a fair and unbiased evaluation, dataset partitioning was performed prior to any preprocessing or augmentation operations, and each image was assigned exclusively to the training, validation, or test subset. Data augmentation was applied only to the training set, eliminating the possibility of data leakage. Four state-of-the-art deep learning architectures, EfficientNet-B2, ConvNeXt-Tiny, MaxViT-T, and ResNet-50, were trained and evaluated under identical experimental conditions using the same preprocessing pipeline, training strategy, and dataset split. Model performance was assessed using accuracy, precision, recall, F1-score, ROC-AUC, confusion matrices, and explainability-based activation and attention heat maps. All evaluated models achieved classification accuracies exceeding 98%, demonstrating strong capability for EL-based defect detection. EfficientNet-B2 achieved the highest numerical performance, reaching 99.31% accuracy, 0.9931 F1-score, and 0.9987 ROC-AUC. MaxViT-T exhibited similarly strong performance with rapid convergence and balanced class-wise metrics, while ConvNeXt-Tiny and ResNet-50 also produced highly reliable results. Heat map visualizations revealed that EfficientNet-B2 and MaxViT-T concentrated their attention more precisely on defect regions such as cracks and fractures, providing visual interpretability in addition to quantitative performance. The results demonstrate that modern deep learning architectures can accurately and reliably detect photovoltaic cell defects from EL images under a unified binary classification framework. Furthermore, explainability techniques enhance the transparency of model predictions, supporting the practical deployment of intelligent inspection systems for photovoltaic manufacturing and maintenance applications.
Keywords: deep learning; photovoltaic cells; electroluminescence imaging; defect detection; EfficientNet-B2; ConvNeXt-Tiny; MaxViT-T; ResNet-50; binary classification; explainable artificial intelligence; ROC-AUC; heat maps deep learning; photovoltaic cells; electroluminescence imaging; defect detection; EfficientNet-B2; ConvNeXt-Tiny; MaxViT-T; ResNet-50; binary classification; explainable artificial intelligence; ROC-AUC; heat maps

Share and Cite

MDPI and ACS Style

Şahin, G.; Rüstemli, A.C.; Al-Ani, A.Y.B.; Rüstemli, S.; Akin, E. Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection. Sensors 2026, 26, 4256. https://doi.org/10.3390/s26134256

AMA Style

Şahin G, Rüstemli AC, Al-Ani AYB, Rüstemli S, Akin E. Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection. Sensors. 2026; 26(13):4256. https://doi.org/10.3390/s26134256

Chicago/Turabian Style

Şahin, Gökhan, Ali Cengiz Rüstemli, Ahmed Yaseen Bishree Al-Ani, Sabir Rüstemli, and Erdal Akin. 2026. "Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection" Sensors 26, no. 13: 4256. https://doi.org/10.3390/s26134256

APA Style

Şahin, G., Rüstemli, A. C., Al-Ani, A. Y. B., Rüstemli, S., & Akin, E. (2026). Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection. Sensors, 26(13), 4256. https://doi.org/10.3390/s26134256

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