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POLD-YOLO: A Lightweight YOLO11-Based Algorithm for Insulator Defect Detection in UAV Aerial Images
 
 

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Journal: Sensors, 2026
Volume: 26
Number: 4169

Article: A Lightweight Insulator Defect Detection Model for Edge Computing Devices: PEBL-YOLO
Authors: by Hao Wang, Jie Li and Qi Xing
Link: https://www.mdpi.com/1424-8220/26/13/4169

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