Leakage Current Analysis of Glass, Porcelain, and Silicone Insulators Under Icing Conditions Using Spectrogram-Based Deep Convolutional Neural Networks
Abstract
1. Introduction
- (1)
- A comprehensive experimental dataset has been established to analyze the leakage current characteristics of porcelain, glass, and silicone insulators with single, double, and triple unit structures under varying icing conditions (ice-free, slightly iced, and iced) at voltage levels ranging from 10 to 50 kV.
- (2)
- A two-stage preprocessing approach, comprising a Butterworth low-pass filter and a moving average smoothing filter, has been developed to eliminate noise in low-amplitude and rapidly varying leakage current data while keeping their distinguishing features.
- (3)
- To process information in the time–frequency plane more efficiently, raw signals were converted into spectrogram images, and a novel CNN architecture incorporating Residual-Inception blocks was designed to enhance feature extraction capabilities.
- (4)
- The proposed model demonstrated superior discriminative representation capability and generalization performance compared with established architectures in the literature, such as AlexNet, GoogLeNet, and ResNet-50, achieving accuracy rates of up to 100% across different voltage levels, particularly for glass and silicone insulators.
2. Analysis of Leakage Current Under Varied Thermal Conditions
2.1. Mathematical Model of the Effect of Ice on Insulator Leakage Current Behavior
2.2. Effect of Ice Melting on Leakage Current of Insulators Under High Voltage
3. Materials and Methods
3.1. Experimental Setup
3.2. Signal Preprocessing
3.3. Statistical Analysis
4. Spectrogram-Based Deep Convolutional Neural Network Approach for Leakage Current Detection in Ice-Covered Insulators
4.1. Spectrogram-Based Feature Extraction
4.2. Deep Convolutional Neural Network Architecture and Classification
4.3. Performance Evaluation Metrics
5. Discussion
5.1. Data Validation and Statistical Characterization
5.2. Performance Evaluation and Comparative Analysis of CNN Architectures
6. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Stage | Layer Configuration | Kernel/Stride/Dilation | Output Size |
|---|---|---|---|
| Input | Spectrogram image | – | 256 × 8 × 3 |
| Stem | Conv + BN + ReLU | 7 × 1/2 × 1/1 | 128 × 8 × 32 |
| Conv + BN + ReLU | 1 × 3/1 × 1/1 | 128 × 8 × 32 | |
| MaxPooling | 2 × 1/2 × 1 | 64 × 8 × 32 | |
| Stage A | Conv + BN + ReLU | 5 × 1/1 × 1/2 | 64 × 8 × 64 |
| Conv + BN | 1 × 3/1 × 1/1 | 64 × 8 × 64 | |
| Skip connection (1 × 1 Conv) | 1 × 1/1 × 1 | 64 × 8 × 64 | |
| Residual addition + ReLU | – | 64 × 8 × 64 | |
| MaxPooling | 2 × 1/2 × 1 | 32 × 8 × 64 | |
| Stage B | Conv + BN + ReLU | 5 × 1/1 × 1/4 | 32 × 8 × 96 |
| Conv + BN | 1 × 3/1 × 1/1 | 32 × 8 × 96 | |
| Skip connection (1 × 1 Conv) | 1 × 1/1 × 1 | 32 × 8 × 96 | |
| Residual addition + ReLU | – | 32 × 8 × 96 | |
| MaxPooling | 2 × 1/2 × 1 | 16 × 8 × 96 | |
| Stage C | Conv + BN + ReLU | 7 × 1/1 × 1/8 | 16 × 8 × 128 |
| Conv + BN | 1 × 3/1 × 1/1 | 16 × 8 × 128 | |
| Skip connection (1 × 1 Conv) | 1 × 1/1 × 1 | 16 × 8 × 128 | |
| Residual addition + ReLU | – | 16 × 8 × 128 | |
| Classification head | Global Average Pooling | – | 1 × 1 × 128 |
| Dropout | p = 0.3 | 1 × 1 × 128 | |
| Fully Connected | 3 neurons | 1 × 1 × 3 | |
| Output | Softmax classifier | 3 classes | 1 × 1 × 3 |
| Insulator Type | Voltage (kV)–Number of Units | Levene p-Value | ANOVA p-Value | Kruskal–Wallis p-Value |
|---|---|---|---|---|
| Porcelain | 10 kV–1U | 2.018 × 10−213 | 0.0443 | 5.1435 × 10−5 |
| Porcelain | 20 kV–1U | 3.640 × 10−148 | 3.7996 × 10−6 | 0.0554 |
| Porcelain | 30 kV–1U | <0.001 | 1.3194 × 10−5 | 0.0012 |
| Porcelain | 20 kV–2U | 0.0554 | 3.7996 × 10−6 | 0.0554 |
| Porcelain | 30 kV–2U | 6.0411 × 10−8 | 0.0133 | 6.0411 × 10−8 |
| Porcelain | 40 kV–2U | 6.5799 × 10−18 | 0.0025 | 6.5799 × 10−18 |
| Porcelain | 30 kV–3U | 1.4735 × 10−7 | 0.3392 | 1.4735 × 10−7 |
| Porcelain | 40 kV–3U | 1.8699 × 10−32 | 0.0163 | 1.8699 × 10−32 |
| Porcelain | 50 kV–3U | 4.5896 × 10−6 | 2.7188 × 10−9 | 4.5896 × 10−6 |
| Glass | 10 kV–1U | <0.001 | 2.0547 × 10−7 | 0.3269 |
| Glass | 20 kV–1U | <0.001 | <0.001 | 2.8110 × 10−131 |
| Glass | 30 kV–1U | <0.001 | 5.1427 × 10−12 | 6.0602 × 10−31 |
| Glass | 20 kV–2U | 2.8110 × 10−131 | <0.001 | 2.8110 × 10−131 |
| Glass | 30 kV–2U | 0.1597 | 0.8588 | 0.1597 |
| Glass | 40 kV–2U | 1.2168 × 10−12 | 1.7831 × 10−5 | 1.2168 × 10−12 |
| Glass | 30 kV–3U | 0.0092 | 0.2339 | 0.0092 |
| Glass | 40 kV–3U | 3.1220 × 10−10 | 5.5993 × 10−25 | 3.1220 × 10−10 |
| Glass | 50 kV–3U | 1.8433 × 10−49 | 3.0464 × 10−93 | 1.8433 × 10−49 |
| Silicone | 30 kV–1U | <0.001 | 1.5212 × 10−8 | 6.2293 × 10−34 |
| Silicone | 40 kV–1U | <0.001 | 5.8716 × 10−12 | 4.0739 × 10−79 |
| Silicone | 50 kV–1U | <0.001 | 2.2652 × 10−103 | 9.2207 × 10−204 |
| Insulator Type | Voltage (kV)–Number of Units | Accuracy | Sensitivity | Specificity | Precision | F1-Score |
|---|---|---|---|---|---|---|
| Porcelain | 10 kV–1U | 0.9778 | 0.9778 | 0.9889 | 0.9792 | 0.9778 |
| Porcelain | 20 kV–1U | 0.9778 | 0.9778 | 0.9889 | 0.9792 | 0.9778 |
| Porcelain | 30 kV–1U | 0.9333 | 0.9333 | 0.9667 | 0.9345 | 0.9333 |
| Porcelain | 20 kV–2U | 0.9111 | 0.9111 | 0.9556 | 0.9298 | 0.9095 |
| Porcelain | 30 kV–2U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Porcelain | 40 kV–2U | 0.8889 | 0.8889 | 0.9444 | 0.9167 | 0.8857 |
| Porcelain | 30 kV–3U | 0.8889 | 0.8889 | 0.9444 | 0.9167 | 0.8857 |
| Porcelain | 40 kV–3U | 0.9333 | 0.9333 | 0.9667 | 0.9345 | 0.9333 |
| Porcelain | 50 kV–3U | 0.8222 | 0.8222 | 0.9111 | 0.8250 | 0.8214 |
| Glass | 10 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 20 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 30 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 20 kV–2U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 30 kV–2U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 40 kV–2U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 30 kV–3U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 40 kV–3U | 0.9333 | 0.9333 | 0.9667 | 0.9345 | 0.9333 |
| Glass | 50 kV–3U | 0.9778 | 0.9778 | 0.9889 | 0.9792 | 0.9778 |
| Silicone | 30 kV–1U | 0.9778 | 0.9778 | 0.9889 | 0.9792 | 0.9778 |
| Silicone | 40 kV–1U | 0.9778 | 0.9778 | 0.9889 | 0.9792 | 0.9778 |
| Silicone | 50 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Insulator Type | Voltage (kV)–Number of Units | Proposed CNN Model | AlexNet | GoogLeNet | ResNet-50 |
|---|---|---|---|---|---|
| Porcelain | 10 kV–1U | 0.9778 | 0.8444 | 0.8889 | 0.8889 |
| Porcelain | 20 kV–1U | 0.9778 | 0.9111 | 0.9111 | 0.9333 |
| Porcelain | 30 kV–1U | 0.9333 | 0.8667 | 0.9333 | 0.9111 |
| Porcelain | 20 kV–2U | 0.9111 | 0.8667 | 0.8222 | 0.8889 |
| Porcelain | 30 kV–2U | 1.0000 | 0.9777 | 0.9111 | 0.9778 |
| Porcelain | 40 kV–2U | 0.8889 | 0.8667 | 0.8444 | 0.7556 |
| Porcelain | 30 kV–3U | 0.8889 | 0.8000 | 0.8000 | 0.8000 |
| Porcelain | 40 kV–3U | 0.9333 | 0.8444 | 0.9333 | 0.9333 |
| Porcelain | 50 kV–3U | 0.8222 | 0.8000 | 0.7778 | 0.7333 |
| Glass | 10 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 20 kV–1U | 1.0000 | 1.0000 | 1.0000 | 1.0000 |
| Glass | 30 kV–1U | 1.0000 | 0.8889 | 0.8444 | 0.9778 |
| Glass | 20 kV–2U | 1.0000 | 1.0000 | 0.9778 | 0.9778 |
| Glass | 30 kV–2U | 1.0000 | 1.0000 | 0.9556 | 1.0000 |
| Glass | 40 kV–2U | 1.0000 | 1.0000 | 0.9556 | 0.9333 |
| Glass | 30 kV–3U | 1.0000 | 0.9556 | 0.8889 | 0.9111 |
| Glass | 40 kV–3U | 0.9333 | 0.9111 | 0.8667 | 0.9556 |
| Glass | 50 kV–3U | 0.9778 | 0.9111 | 0.9111 | 0.9333 |
| Silicone | 30 kV–1U | 0.9778 | 0.8889 | 0.9556 | 0.8889 |
| Silicone | 40 kV–1U | 0.9778 | 0.9556 | 0.9778 | 0.9556 |
| Silicone | 50 kV–1U | 1.0000 | 0.8889 | 0.8667 | 0.9111 |
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Özküçük, M.B.; Alçin, Ö.F.; Gençoğlu, M.T. Leakage Current Analysis of Glass, Porcelain, and Silicone Insulators Under Icing Conditions Using Spectrogram-Based Deep Convolutional Neural Networks. Sensors 2026, 26, 4121. https://doi.org/10.3390/s26134121
Özküçük MB, Alçin ÖF, Gençoğlu MT. Leakage Current Analysis of Glass, Porcelain, and Silicone Insulators Under Icing Conditions Using Spectrogram-Based Deep Convolutional Neural Networks. Sensors. 2026; 26(13):4121. https://doi.org/10.3390/s26134121
Chicago/Turabian StyleÖzküçük, Muhammed Buğracan, Ömer Faruk Alçin, and Muhsin Tunay Gençoğlu. 2026. "Leakage Current Analysis of Glass, Porcelain, and Silicone Insulators Under Icing Conditions Using Spectrogram-Based Deep Convolutional Neural Networks" Sensors 26, no. 13: 4121. https://doi.org/10.3390/s26134121
APA StyleÖzküçük, M. B., Alçin, Ö. F., & Gençoğlu, M. T. (2026). Leakage Current Analysis of Glass, Porcelain, and Silicone Insulators Under Icing Conditions Using Spectrogram-Based Deep Convolutional Neural Networks. Sensors, 26(13), 4121. https://doi.org/10.3390/s26134121

