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Journal: Sensors, 2026
Volume: 26
Number: 3774

Article: Reliability Assessment of MEMS Gyroscopes via Dual-Mechanism Synergistic Degradation: A Generalized Linear Model with Physics-Informed Wiener Processes
Authors: by Pengbin Yang, Zhen Liu, Yuhang Liang, Xinfeng Guo and Hang Geng
Link: https://www.mdpi.com/1424-8220/26/12/3774

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