Wang, Y.; Chen, Z.; Wang, J.; Shang, P.; Sowmya, A.; Sun, C.
Printed Circuit Board Defect Detection Based on Lightweight Deep Learning Fusion Model. Sensors 2025, 25, 7403.
https://doi.org/10.3390/s25247403
AMA Style
Wang Y, Chen Z, Wang J, Shang P, Sowmya A, Sun C.
Printed Circuit Board Defect Detection Based on Lightweight Deep Learning Fusion Model. Sensors. 2025; 25(24):7403.
https://doi.org/10.3390/s25247403
Chicago/Turabian Style
Wang, Yuling, Zhicheng Chen, Jie Wang, Peng Shang, Arcot Sowmya, and Changming Sun.
2025. "Printed Circuit Board Defect Detection Based on Lightweight Deep Learning Fusion Model" Sensors 25, no. 24: 7403.
https://doi.org/10.3390/s25247403
APA Style
Wang, Y., Chen, Z., Wang, J., Shang, P., Sowmya, A., & Sun, C.
(2025). Printed Circuit Board Defect Detection Based on Lightweight Deep Learning Fusion Model. Sensors, 25(24), 7403.
https://doi.org/10.3390/s25247403