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Article

Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging

1
Department of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea
2
Panoptics Corp., Seongnam 13516, Republic of Korea
*
Author to whom correspondence should be addressed.
Sensors 2025, 25(16), 5160; https://doi.org/10.3390/s25165160 (registering DOI)
Submission received: 12 July 2025 / Revised: 7 August 2025 / Accepted: 17 August 2025 / Published: 19 August 2025
(This article belongs to the Special Issue Feature Papers in Sensing and Imaging 2025)

Abstract

In this study, we used rapid terahertz (THz) time-of-flight (ToF) imaging to identify counterfeit electronics prevalent in the online market. THz-ToF allows the nondestructive reflection imaging of portable electronic devices enclosed by plastic cases with a spatial resolution of 1 mm and a depth range larger than 5 mm. For instance, we could identify a counterfeit solid-state device because there was a striking difference in the internal structure compared with that of an authentic device, although its appearance was similar. It is also possible to authenticate small portable devices with arbitrary shapes, such as earphones; THz-ToF imaging can be applied to authentication from a variety of perspectives. Importantly, our technique is particularly useful for identifying the inappropriate use of integrated circuit (IC) chips, such as controller chips in USB hub devices. THz-TDS images for various portable and wearable devices will be useful for rapid in-line authentication of products and will offer an effective tool for identifying fake electronics and the inappropriate use of IC chips in various equipment.
Keywords: terahertz imaging; authentication; nondestructive testing; time-of-flight terahertz imaging; authentication; nondestructive testing; time-of-flight

Share and Cite

MDPI and ACS Style

Ryu, H.; Son, B.H.; Kim, J.; Kim, J.; Ahn, Y.H. Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging. Sensors 2025, 25, 5160. https://doi.org/10.3390/s25165160

AMA Style

Ryu H, Son BH, Kim J, Kim J, Ahn YH. Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging. Sensors. 2025; 25(16):5160. https://doi.org/10.3390/s25165160

Chicago/Turabian Style

Ryu, Hyeonseung, Byung Hee Son, Jihwan Kim, Jangsun Kim, and Yeong Hwan Ahn. 2025. "Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging" Sensors 25, no. 16: 5160. https://doi.org/10.3390/s25165160

APA Style

Ryu, H., Son, B. H., Kim, J., Kim, J., & Ahn, Y. H. (2025). Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging. Sensors, 25(16), 5160. https://doi.org/10.3390/s25165160

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