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Journal: Sensors, 2025
Volume: 25
Number: 4828
Article:
A Junction Temperature Prediction Method Based on Multivariate Linear Regression Using Current Fall Characteristics of SiC MOSFETs
Authors:
by
Haihong Qin, Yang Zhang, Yu Zeng, Yuan Kang, Ziyue Zhu and Fan Wu
Link:
https://www.mdpi.com/1424-8220/25/15/4828
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