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Journal: Sensors, 2025
Volume: 25
Number: 4266

Article: A Sparse Bayesian Technique to Learn the Frequency-Domain Active Regressors in OFDM Wireless Systems
Authors: by Carlos Crespo-Cadenas, María José Madero-Ayora, Juan A. Becerra, Elías Marqués-Valderrama and Sergio Cruces
Link: https://www.mdpi.com/1424-8220/25/14/4266

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