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Journal: Sensors, 2025
Volume: 25
Number: 4266
Article:
A Sparse Bayesian Technique to Learn the Frequency-Domain Active Regressors in OFDM Wireless Systems
Authors:
by
Carlos Crespo-Cadenas, MarÃa José Madero-Ayora, Juan A. Becerra, ElÃas Marqués-Valderrama and Sergio Cruces
Link:
https://www.mdpi.com/1424-8220/25/14/4266
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