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Journal: Sensors, 2025
Volume: 25
Number: 3859

Article: RST-YOLOv8: An Improved Chip Surface Defect Detection Model Based on YOLOv8
Authors: by Wenjie Tang, Yangjun Deng and Xu Luo
Link: https://www.mdpi.com/1424-8220/25/13/3859

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