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Journal: Sensors, 2025
Volume: 25
Number: 3859
Article:
RST-YOLOv8: An Improved Chip Surface Defect Detection Model Based on YOLOv8
Authors:
by
Wenjie Tang, Yangjun Deng and Xu Luo
Link:
https://www.mdpi.com/1424-8220/25/13/3859
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