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Journal: Sensors, 2025
Volume: 25
Number: 277

Article: Leveraging Segment Anything Model (SAM) for Weld Defect Detection in Industrial Ultrasonic B-Scan Images
Authors: by Amir-M. Naddaf-Sh, Vinay S. Baburao and Hassan Zargarzadeh
Link: https://www.mdpi.com/1424-8220/25/1/277

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