Guo, L.; Xiong, F.; Cao, Y.; Xue, H.; Cui, L.; Han, X.
Focusing on Cracks with Instance Normalization Wavelet Layer. Sensors 2025, 25, 146.
https://doi.org/10.3390/s25010146
AMA Style
Guo L, Xiong F, Cao Y, Xue H, Cui L, Han X.
Focusing on Cracks with Instance Normalization Wavelet Layer. Sensors. 2025; 25(1):146.
https://doi.org/10.3390/s25010146
Chicago/Turabian Style
Guo, Lei, Fengguang Xiong, Yaming Cao, Hongxin Xue, Lei Cui, and Xie Han.
2025. "Focusing on Cracks with Instance Normalization Wavelet Layer" Sensors 25, no. 1: 146.
https://doi.org/10.3390/s25010146
APA Style
Guo, L., Xiong, F., Cao, Y., Xue, H., Cui, L., & Han, X.
(2025). Focusing on Cracks with Instance Normalization Wavelet Layer. Sensors, 25(1), 146.
https://doi.org/10.3390/s25010146