Fasani, D.; Barbieri, L.; Villa, A.; Palladini, D.; Malgesini, R.; D’Avanzo, G.; Buccella, G.; Gadia, P.
Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor. Sensors 2024, 24, 1359.
https://doi.org/10.3390/s24051359
AMA Style
Fasani D, Barbieri L, Villa A, Palladini D, Malgesini R, D’Avanzo G, Buccella G, Gadia P.
Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor. Sensors. 2024; 24(5):1359.
https://doi.org/10.3390/s24051359
Chicago/Turabian Style
Fasani, Damiano, Luca Barbieri, Andrea Villa, Daniele Palladini, Roberto Malgesini, Giovanni D’Avanzo, Giacomo Buccella, and Paolo Gadia.
2024. "Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor" Sensors 24, no. 5: 1359.
https://doi.org/10.3390/s24051359
APA Style
Fasani, D., Barbieri, L., Villa, A., Palladini, D., Malgesini, R., D’Avanzo, G., Buccella, G., & Gadia, P.
(2024). Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor. Sensors, 24(5), 1359.
https://doi.org/10.3390/s24051359