Chen, Y.;                     Deng, C.;                     Sun, Q.;                     Wu, Z.;                     Zou, L.;                     Zhang, G.;                     Li, W.    
        Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors 2024, 24, 290.
    https://doi.org/10.3390/s24010290
    AMA Style
    
                                Chen Y,                                 Deng C,                                 Sun Q,                                 Wu Z,                                 Zou L,                                 Zhang G,                                 Li W.        
                Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors. 2024; 24(1):290.
        https://doi.org/10.3390/s24010290
    
    Chicago/Turabian Style
    
                                Chen, Yanping,                                 Chong Deng,                                 Qiang Sun,                                 Zhize Wu,                                 Le Zou,                                 Guanhong Zhang,                                 and Wenbo Li.        
                2024. "Lightweight Detection Methods for Insulator Self-Explosion Defects" Sensors 24, no. 1: 290.
        https://doi.org/10.3390/s24010290
    
    APA Style
    
                                Chen, Y.,                                 Deng, C.,                                 Sun, Q.,                                 Wu, Z.,                                 Zou, L.,                                 Zhang, G.,                                 & Li, W.        
        
        (2024). Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors, 24(1), 290.
        https://doi.org/10.3390/s24010290