Chen, Y.; Deng, C.; Sun, Q.; Wu, Z.; Zou, L.; Zhang, G.; Li, W.
Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors 2024, 24, 290.
https://doi.org/10.3390/s24010290
AMA Style
Chen Y, Deng C, Sun Q, Wu Z, Zou L, Zhang G, Li W.
Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors. 2024; 24(1):290.
https://doi.org/10.3390/s24010290
Chicago/Turabian Style
Chen, Yanping, Chong Deng, Qiang Sun, Zhize Wu, Le Zou, Guanhong Zhang, and Wenbo Li.
2024. "Lightweight Detection Methods for Insulator Self-Explosion Defects" Sensors 24, no. 1: 290.
https://doi.org/10.3390/s24010290
APA Style
Chen, Y., Deng, C., Sun, Q., Wu, Z., Zou, L., Zhang, G., & Li, W.
(2024). Lightweight Detection Methods for Insulator Self-Explosion Defects. Sensors, 24(1), 290.
https://doi.org/10.3390/s24010290