Zhou, Y.; Lin, X.; Luo, S.; Ding, S.; Xiao, L.; Ren, C.
Multi-Scene Mask Detection Based on Multi-Scale Residual and Complementary Attention Mechanism. Sensors 2023, 23, 8851.
https://doi.org/10.3390/s23218851
AMA Style
Zhou Y, Lin X, Luo S, Ding S, Xiao L, Ren C.
Multi-Scene Mask Detection Based on Multi-Scale Residual and Complementary Attention Mechanism. Sensors. 2023; 23(21):8851.
https://doi.org/10.3390/s23218851
Chicago/Turabian Style
Zhou, Yuting, Xin Lin, Shi Luo, Sixian Ding, Luyang Xiao, and Chao Ren.
2023. "Multi-Scene Mask Detection Based on Multi-Scale Residual and Complementary Attention Mechanism" Sensors 23, no. 21: 8851.
https://doi.org/10.3390/s23218851
APA Style
Zhou, Y., Lin, X., Luo, S., Ding, S., Xiao, L., & Ren, C.
(2023). Multi-Scene Mask Detection Based on Multi-Scale Residual and Complementary Attention Mechanism. Sensors, 23(21), 8851.
https://doi.org/10.3390/s23218851