Laštovička-Medin, G.; Rebarz, M.; Doknic, J.; Bozovic, I.; Kramberger, G.; Laštovička, T.; Andreasson, J.
Exploring the Interpad Gap Region in Ultra-Fast Silicon Detectors: Insights into Isolation Structure and Electric Field Effects on Charge Multiplication. Sensors 2023, 23, 6746.
https://doi.org/10.3390/s23156746
AMA Style
Laštovička-Medin G, Rebarz M, Doknic J, Bozovic I, Kramberger G, Laštovička T, Andreasson J.
Exploring the Interpad Gap Region in Ultra-Fast Silicon Detectors: Insights into Isolation Structure and Electric Field Effects on Charge Multiplication. Sensors. 2023; 23(15):6746.
https://doi.org/10.3390/s23156746
Chicago/Turabian Style
Laštovička-Medin, Gordana, Mateusz Rebarz, Jovana Doknic, Ivona Bozovic, Gregor Kramberger, Tomáš Laštovička, and Jakob Andreasson.
2023. "Exploring the Interpad Gap Region in Ultra-Fast Silicon Detectors: Insights into Isolation Structure and Electric Field Effects on Charge Multiplication" Sensors 23, no. 15: 6746.
https://doi.org/10.3390/s23156746
APA Style
Laštovička-Medin, G., Rebarz, M., Doknic, J., Bozovic, I., Kramberger, G., Laštovička, T., & Andreasson, J.
(2023). Exploring the Interpad Gap Region in Ultra-Fast Silicon Detectors: Insights into Isolation Structure and Electric Field Effects on Charge Multiplication. Sensors, 23(15), 6746.
https://doi.org/10.3390/s23156746
