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Sensors
Volume 23
Issue 12
10.3390/s23125384
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Journal: Sensors, 2023
Volume: 23
Number: 5384

Article: Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol
Authors: by J. A. Dueñas, A. Cobo, L. López, F. Galtarossa, A. Goasduff, D. Mengoni and A. M. Sánchez-Benítez
Link: https://www.mdpi.com/1424-8220/23/12/5384

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