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        Journal: Sensors, 2023
        Volume: 23 
                	Number: 4871 
                
        
        Article:
        Validation of High-Availability Model for Edge Devices and IIoT 
        Authors: 
       	by
                    Peter Peniak, EmÃlia BubenÃková and Alžbeta Kanáliková        
        Link:
        https://www.mdpi.com/1424-8220/23/10/4871
        
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