Article Versions Notes

Wang H, Tian J, Lu B, Xie Y, Sun P, Yin L, Wang Y, Sheng X. Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium. Sensors. 2022; 22(3):802. https://doi.org/10.3390/s22030802

Wang, Huachun, Jingjing Tian, Bingwei Lu, Yang Xie, Pengcheng Sun, Lan Yin, Yuguang Wang, and Xing Sheng. 2022. "Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium" Sensors 22, no. 3: 802. https://doi.org/10.3390/s22030802

Wang, H., Tian, J., Lu, B., Xie, Y., Sun, P., Yin, L., Wang, Y., & Sheng, X. (2022). Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium. Sensors, 22(3), 802. https://doi.org/10.3390/s22030802