Piotrowska, A.K.; Łaszcz, A.; Zaborowski, M.; Broda, A.; Szmigiel, D.
A New Approach for Sensitive Characterization of Semiconductor Laser Beams Using Metal-Semiconductor Thermocouples. Sensors 2022, 22, 9324.
https://doi.org/10.3390/s22239324
AMA Style
Piotrowska AK, Łaszcz A, Zaborowski M, Broda A, Szmigiel D.
A New Approach for Sensitive Characterization of Semiconductor Laser Beams Using Metal-Semiconductor Thermocouples. Sensors. 2022; 22(23):9324.
https://doi.org/10.3390/s22239324
Chicago/Turabian Style
Piotrowska, Anna Katarzyna, Adam Łaszcz, Michał Zaborowski, Artur Broda, and Dariusz Szmigiel.
2022. "A New Approach for Sensitive Characterization of Semiconductor Laser Beams Using Metal-Semiconductor Thermocouples" Sensors 22, no. 23: 9324.
https://doi.org/10.3390/s22239324
APA Style
Piotrowska, A. K., Łaszcz, A., Zaborowski, M., Broda, A., & Szmigiel, D.
(2022). A New Approach for Sensitive Characterization of Semiconductor Laser Beams Using Metal-Semiconductor Thermocouples. Sensors, 22(23), 9324.
https://doi.org/10.3390/s22239324