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Journal: Sensors, 2022
Volume: 22
Number: 4159

Article: A Universal Testbed for IoT Wireless Technologies: Abstracting Latency, Error Rate and Stability from the IoT Protocol and Hardware Platform
Authors: by Edgar Saavedra, Laura Mascaraque, Gonzalo Calderon, Guillermo del Campo and Asuncion Santamaria
Link: https://www.mdpi.com/1424-8220/22/11/4159

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