Article Versions Notes

Muthu BR, Pushpa EP, Dhandapani V, Jayaraman K, Vasanthakumar H, Oh W-C, Sagadevan S. Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell. Sensors. 2022; 22(1):33. https://doi.org/10.3390/s22010033

Muthu, Bharathi Raj, Ewins Pon Pushpa, Vaithiyanathan Dhandapani, Kamala Jayaraman, Hemalatha Vasanthakumar, Won-Chun Oh, and Suresh Sagadevan. 2022. "Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell" Sensors 22, no. 1: 33. https://doi.org/10.3390/s22010033

Muthu, B. R., Pushpa, E. P., Dhandapani, V., Jayaraman, K., Vasanthakumar, H., Oh, W.-C., & Sagadevan, S. (2022). Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell. Sensors, 22(1), 33. https://doi.org/10.3390/s22010033