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Journal: Sensors, 2021
Volume: 21
Number: 8164
Article:
Completion of Metal-Damaged Traces Based on Deep Learning in Sinogram Domain for Metal Artifacts Reduction in CT Images
Authors:
by
Linlin Zhu, Yu Han, Xiaoqi Xi, Lei Li and Bin Yan
Link:
https://www.mdpi.com/1424-8220/21/24/8164
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