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Journal: Sensors, 2021
Volume: 21
Number: 6023
Article:
Event-Driven Deep Learning for Edge Intelligence (EDL-EI)
Authors:
by
Sayed Khushal Shah, Zeenat Tariq, Jeehwan Lee and Yugyung Lee
Link:
https://www.mdpi.com/1424-8220/21/18/6023
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