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Journal: Sensors, 2021
Volume: 21
Number: 5862
Article:
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control
Authors:
by
Ingo Ortlepp, Jaqueline Stauffenberg and Eberhard Manske
Link:
https://www.mdpi.com/1424-8220/21/17/5862
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