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Furnari G, Vattiato F, Allegra D, Milotta FLM, Orofino A, Rizzo R, De Palo RA, Stanco F. An Ensembled Anomaly Detector for Wafer Fault Detection. Sensors. 2021; 21(16):5465. https://doi.org/10.3390/s21165465

Furnari, Giuseppe, Francesco Vattiato, Dario Allegra, Filippo Luigi Maria Milotta, Alessandro Orofino, Rosetta Rizzo, Rosaria Angela De Palo, and Filippo Stanco. 2021. "An Ensembled Anomaly Detector for Wafer Fault Detection" Sensors 21, no. 16: 5465. https://doi.org/10.3390/s21165465

Furnari, G., Vattiato, F., Allegra, D., Milotta, F. L. M., Orofino, A., Rizzo, R., De Palo, R. A., & Stanco, F. (2021). An Ensembled Anomaly Detector for Wafer Fault Detection. Sensors, 21(16), 5465. https://doi.org/10.3390/s21165465