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Article

Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology

1
Electronics Department, Polytechnic School, University of Alcalá, 28871 Madrid, Spain
2
Institute of Geodesy and Photogrammetry, ETH Zurich, 8093 Zurich, Switzerland
*
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Academic Editor: Lucio Pancheri
Sensors 2021, 21(10), 3455; https://doi.org/10.3390/s21103455
Received: 12 April 2021 / Revised: 11 May 2021 / Accepted: 13 May 2021 / Published: 15 May 2021
(This article belongs to the Section Electronic Sensors)
Transimpedance amplifiers (TIA) are widely used for front-end signal conditioning in many optical distance measuring applications in which high accuracy is often required. Small effects due to the real characteristics of the components and the parasitic elements in the circuit board may cause the error to rise to unacceptable levels. In this work we study these effects on the TIA delay time error and deduce analytic expressions, taking into account the trade-off between the uncertainties caused by the delay time instability and by the signal-to-noise ratio. A specific continuous-wave phase-shift case study is shown to illustrate the analysis, and further compared with real measurements. General strategies and conclusions, useful for designers of this kind of system, are extracted too. The study and results show that the delay time thermal stability is a key determinant factor in the measured distance accuracy and, without an adequate design, moderate temperature variations of the TIA can cause extremely high measurement errors. View Full-Text
Keywords: transimpedance amplifiers; delay time; phase stability; thermal drifts; signal to noise ratio; distance measurement transimpedance amplifiers; delay time; phase stability; thermal drifts; signal to noise ratio; distance measurement
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MDPI and ACS Style

Meca Meca, F.J.; Martín-Gorostiza, E.; García-Garrido, M.Á.; Salido-Monzú, D. Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology. Sensors 2021, 21, 3455. https://doi.org/10.3390/s21103455

AMA Style

Meca Meca FJ, Martín-Gorostiza E, García-Garrido MÁ, Salido-Monzú D. Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology. Sensors. 2021; 21(10):3455. https://doi.org/10.3390/s21103455

Chicago/Turabian Style

Meca Meca, Francisco J., Ernesto Martín-Gorostiza, Miguel Á. García-Garrido, and David Salido-Monzú. 2021. "Phase Stability under Thermal Drifts in Photodiode-Conditioning Transimpedance Amplifiers for Distance Metrology" Sensors 21, no. 10: 3455. https://doi.org/10.3390/s21103455

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