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Journal: Sensors, 2020
Volume: 20
Number: 2581
2581
Article: Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits
Authors: by Md Arifur R. Sarker, Seungwoo Jung, Adrian Ildefonso, Ani Khachatrian, Stephen P. Buchner, Dale McMorrow, Pauline Paki, John D. Cressler and Ickhyun Song
Link: https://www.mdpi.com/1424-8220/20/9/2581

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