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Journal: Sensors, 2020
Volume: 20
Number: 6426

Article: Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy
Authors: by Mabel Ruiz-Lopez, Masoud Mehrjoo, Barbara Keitel, Elke Plönjes, Domenico Alj, Guillaume Dovillaire, Lu Li and Philippe Zeitoun
Link: https://www.mdpi.com/1424-8220/20/22/6426

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