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Journal: Sensors, 2020
Volume: 20
Number: 5013

Article: A Novel Inspection Technique for Electronic Components Using Thermography (NITECT)
Authors: by Haochen Liu, Lawrence Tinsley, Wayne Lam, Sri Addepalli, Xiaochen Liu, Andrew Starr and Yifan Zhao
Link: https://www.mdpi.com/1424-8220/20/17/5013

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