Brand, U.; Xu, M.; Doering, L.; Langfahl-Klabes, J.; Behle, H.; Bütefisch, S.; Ahbe, T.; Peiner, E.; Völlmeke, S.; Frank, T.;
et al. Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm. Sensors 2019, 19, 1410.
https://doi.org/10.3390/s19061410
AMA Style
Brand U, Xu M, Doering L, Langfahl-Klabes J, Behle H, Bütefisch S, Ahbe T, Peiner E, Völlmeke S, Frank T,
et al. Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm. Sensors. 2019; 19(6):1410.
https://doi.org/10.3390/s19061410
Chicago/Turabian Style
Brand, Uwe, Min Xu, Lutz Doering, Jannick Langfahl-Klabes, Heinrich Behle, Sebastian Bütefisch, Thomas Ahbe, Erwin Peiner, Stefan Völlmeke, Thomas Frank,
and et al. 2019. "Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm" Sensors 19, no. 6: 1410.
https://doi.org/10.3390/s19061410
APA Style
Brand, U., Xu, M., Doering, L., Langfahl-Klabes, J., Behle, H., Bütefisch, S., Ahbe, T., Peiner, E., Völlmeke, S., Frank, T., Mickan, B., Kiselev, I., Hauptmannl, M., & Drexel, M.
(2019). Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm. Sensors, 19(6), 1410.
https://doi.org/10.3390/s19061410