Carfagni, M.;                     Furferi, R.;                     Governi, L.;                     Santarelli, C.;                     Servi, M.;                     Uccheddu, F.;                     Volpe, Y.    
        Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera. Sensors 2019, 19, 489.
    https://doi.org/10.3390/s19030489
    AMA Style
    
                                Carfagni M,                                 Furferi R,                                 Governi L,                                 Santarelli C,                                 Servi M,                                 Uccheddu F,                                 Volpe Y.        
                Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera. Sensors. 2019; 19(3):489.
        https://doi.org/10.3390/s19030489
    
    Chicago/Turabian Style
    
                                Carfagni, Monica,                                 Rocco Furferi,                                 Lapo Governi,                                 Chiara Santarelli,                                 Michaela Servi,                                 Francesca Uccheddu,                                 and Yary Volpe.        
                2019. "Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera" Sensors 19, no. 3: 489.
        https://doi.org/10.3390/s19030489
    
    APA Style
    
                                Carfagni, M.,                                 Furferi, R.,                                 Governi, L.,                                 Santarelli, C.,                                 Servi, M.,                                 Uccheddu, F.,                                 & Volpe, Y.        
        
        (2019). Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera. Sensors, 19(3), 489.
        https://doi.org/10.3390/s19030489