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Journal: Sensors, 2019
Volume: 19
Number: 5550
5550
Article: Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage
Authors: by Alexandre Le Roch, Vincent Goiffon, Olivier Marcelot, Philippe Paillet, Federico Pace, Jean-Marc Belloir, Pierre Magnan and Cédric Virmontois
Link: https://www.mdpi.com/1424-8220/19/24/5550

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