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Chao CY-P, Yeh S-F, Wu M-H, Chou K-Y, Tu H, Lee C-L, Yin C, Paillet P, Goiffon V. Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. Sensors. 2019; 19(24):5447. https://doi.org/10.3390/s19245447

Chao, Calvin Yi-Ping, Shang-Fu Yeh, Meng-Hsu Wu, Kuo-Yu Chou, Honyih Tu, Chih-Lin Lee, Chin Yin, Philippe Paillet, and Vincent Goiffon. 2019. "Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors" Sensors 19, no. 24: 5447. https://doi.org/10.3390/s19245447

Chao, C. Y.-P., Yeh, S.-F., Wu, M.-H., Chou, K.-Y., Tu, H., Lee, C.-L., Yin, C., Paillet, P., & Goiffon, V. (2019). Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. Sensors, 19(24), 5447. https://doi.org/10.3390/s19245447