Next Article in Journal
Calibration Method of Orthogonally Splitting Imaging Pose Sensor Based on KDFcmPUM
Previous Article in Journal
Automatic Multi-Camera Extrinsic Parameter Calibration Based on Pedestrian Torsors
Previous Article in Special Issue
Fully Coupled Model for Frequency Response Simulation of Miniaturized Cantilever-Based Photoacoustic Gas Sensors
Open AccessArticle

Contact Resonance Atomic Force Microscopy Using Long, Massive Tips

Mechanical Engineering Department, University of Nevada, Reno, 1664 N. Virginia St, Reno, NV 89557-0312, USA
*
Author to whom correspondence should be addressed.
Sensors 2019, 19(22), 4990; https://doi.org/10.3390/s19224990
Received: 28 October 2019 / Revised: 8 November 2019 / Accepted: 12 November 2019 / Published: 15 November 2019
(This article belongs to the Special Issue Cantilever-Based Sensors)
In this work, we present a new theoretical model for use in contact resonance atomic force microscopy. This model incorporates the effects of a long, massive sensing tip and is especially useful to interpret operation in the so-called trolling mode. The model is based on traditional Euler–Bernoulli beam theory, whereby the effect of the tip as well as of the sample in contact, modeled as an elastic substrate, are captured by appropriate boundary conditions. A novel interpretation of the flexural and torsional modes of vibration of the cantilever, when not in contact with the sample, is used to estimate the inertia properties of the long, massive tip. Using this information, sample elastic properties are then estimated from the in-contact resonance frequencies of the system. The predictive capability of the proposed model is verified via finite element analysis. Different combinations of cantilever geometry, tip geometry, and sample stiffness are investigated. The model’s accurate predictive ranges are discussed and shown to outperform those of other popular models currently used in contact resonance atomic force microscopy. View Full-Text
Keywords: cantilever based sensors; atomic force microscopy; contact resonance; trolling mode cantilever based sensors; atomic force microscopy; contact resonance; trolling mode
Show Figures

Figure 1

MDPI and ACS Style

Jaquez-Moreno, T.; Aureli, M.; Tung, R.C. Contact Resonance Atomic Force Microscopy Using Long, Massive Tips. Sensors 2019, 19, 4990.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop