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Journal: Sensors, 2019
Volume: 19
Number: 4683

Article: Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry
Authors: by Duc-Hieu Duong, Chin-Sheng Chen and Liang-Chia Chen
Link: https://www.mdpi.com/1424-8220/19/21/4683

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