Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays
1
College of Information Science and Engineering, Xinjiang University, Urumuqi 830046, China
2
Institute of Image Processing and Pattern Recognition, Shanghai Jiao Tong University, Shanghai 200240, China
3
Knowledge Engineering and Discovery Research Institute, Auckland University of Technology, Auckland 1020, New Zealand
*
Author to whom correspondence should be addressed.
Sensors 2019, 19(13), 2975; https://doi.org/10.3390/s19132975
Received: 16 May 2019
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Revised: 19 June 2019
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Accepted: 29 June 2019
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Published: 5 July 2019
(This article belongs to the Section Biosensors)
The gray value method can be used to detect gray value changes of each unit almost parallel to the surface image of PSi (porous silicon) microarrays and indirectly measure the refractive index changes of each unit. However, the speckles of different noise intensities produced by lasers on a porous silicon surface have different effects on the gray value of the measured image. This results in inaccurate results of refractive index changes obtained from the change in gray value. Therefore, it is very important to reduce the influence of speckle noise on measurement results. In this paper, a new algorithm based on the concepts of probability-based nonlocal-means filtering (PNLM), gradient operator, and median filtering is proposed for gray value restoration of porous silicon microarray images. A good linear relationship between gray value change and refractive index change is obtained, which can reduce the influence of speckle noise on the gray value of the PSi microarray image, improving detection accuracy. This means the method based on gray value change detection can be applied to the biological detection of PSi microarray arrays.
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Keywords:
PSi; PNLM; median filtering; speckle noise
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MDPI and ACS Style
Ren, R.; Jia, Z.; Yang, J.; Kasabov, N. Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays. Sensors 2019, 19, 2975. https://doi.org/10.3390/s19132975
AMA Style
Ren R, Jia Z, Yang J, Kasabov N. Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays. Sensors. 2019; 19(13):2975. https://doi.org/10.3390/s19132975
Chicago/Turabian StyleRen, Ruyong, Zhenhong Jia, Jie Yang, and Nikola Kasabov. 2019. "Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays" Sensors 19, no. 13: 2975. https://doi.org/10.3390/s19132975
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